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"A High-Coverage and Efficient Instruction-Level Testing Approach for x86 ..."

Guang Wang et al. (2023)

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DOI: 10.1109/TC.2023.3288762

access: closed

type: Journal Article

metadata version: 2024-02-12

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Guang Wang, Ziyuan Zhu, Xu Cheng, Dan Meng:
A High-Coverage and Efficient Instruction-Level Testing Approach for x86 Processors. IEEE Trans. Computers 72(11): 3203-3217 (2023)

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