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"Study of the Effects of SEU-Induced Faults on a Pipeline Protected ..."

Emmanuel Touloupis et al. (2007)

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DOI: 10.1109/TC.2007.70766

access: closed

type: Journal Article

metadata version: 2022-06-13

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  - https://dblp.org/rec/journals/tc/TouloupisFCW07
Emmanuel Touloupis, James A. Flint, Vassilios A. Chouliaras, David D. Ward:
Study of the Effects of SEU-Induced Faults on a Pipeline Protected Microprocessor. IEEE Trans. Computers 56(12): 1585-1596 (2007)

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