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"A March Test for Functional Faults in Semiconductor Random Access Memories."

Dong S. Suk, Sudhakar M. Reddy (1981)

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DOI: 10.1109/TC.1981.1675739

access: closed

type: Journal Article

metadata version: 2017-05-20

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  dblp key:
  - journals/tc/SukR81
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  persistent URL:
  - https://dblp.org/rec/journals/tc/SukR81
Dong S. Suk, Sudhakar M. Reddy:
A March Test for Functional Faults in Semiconductor Random Access Memories. IEEE Trans. Computers 30(12): 982-985 (1981)

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