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ORCID"Fault Models and Test Methods for Subthreshold SRAMs."
Chen-Wei Lin et al. (2013)
- Chen-Wei Lin, Hung-Hsin Chen, Hao-Yu Yang, Chin-Yuan Huang, Mango Chia-Tso Chao, Rei-Fu Huang:
Fault Models and Test Methods for Subthreshold SRAMs. IEEE Trans. Computers 62(3): 468-481 (2013)
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