"A Comprehensive Scan Test Cost Model to Optimize the Production of Very ..."

Giusy Iaria et al. (2025)

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DOI: 10.1109/TC.2024.3521246

access: open

type: Journal Article

metadata version: 2025-06-15

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Giusy Iaria, Paolo Bernardi, Claudia Bertani, Lorenzo Cardone, Giuseppe Garozzo, Vincenzo Tancorre:
A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs. IEEE Trans. Computers 74(4): 1278-1292 (2025)

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