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"Specification-Driven Conformance Checking for Virtual/Silicon Devices ..."

Haifeng Gu et al. (2021)

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DOI: 10.1109/TC.2020.2988906

access: closed

type: Journal Article

metadata version: 2021-02-18

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Haifeng Gu, Jianning Zhang, Mingsong Chen, Tongquan Wei, Li Lei, Fei Xie:
Specification-Driven Conformance Checking for Virtual/Silicon Devices Using Mutation Testing. IEEE Trans. Computers 70(3): 400-413 (2021)

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