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"Easily Testable Multiple-Valued Logic Circuits Derived from Reed-Muller ..."

Elena Dubrova, Jon C. Muzio (2000)

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DOI: 10.1109/12.895943

access: closed

type: Journal Article

metadata version: 2017-05-20

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  persistent URL:
  - https://dblp.org/rec/journals/tc/DubrovaM00
Elena Dubrova, Jon C. Muzio:
Easily Testable Multiple-Valued Logic Circuits Derived from Reed-Muller Circuits. IEEE Trans. Computers 49(11): 1285-1289 (2000)

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