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"Multiple Fault Testing of Large Circuits by Single Fault Test Sets."

Vinod K. Agarwal, Andy S. F. Fung (1981)

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DOI: 10.1109/TC.1981.1675716

access: closed

type: Journal Article

metadata version: 2017-05-20

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  dblp key:
  - journals/tc/AgarwalF81
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  persistent URL:
  - https://dblp.org/rec/journals/tc/AgarwalF81
Vinod K. Agarwal, Andy S. F. Fung:
Multiple Fault Testing of Large Circuits by Single Fault Test Sets. IEEE Trans. Computers 30(11): 855-865 (1981)

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