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"Matching Misaligned Two-Resolution Metrology Data."

Yaping Wang, Erick Moreno-Centeno, Yu Ding (2017)

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DOI: 10.1109/TASE.2016.2587219

access: closed

type: Journal Article

metadata version: 2020-04-02

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  - journals/tase/WangMD17
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  - https://dblp.org/rec/journals/tase/WangMD17
Yaping Wang, Erick Moreno-Centeno, Yu Ding:
Matching Misaligned Two-Resolution Metrology Data. IEEE Trans Autom. Sci. Eng. 14(1): 222-237 (2017)

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