Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Induced Start Dynamic Sampling for Wafer Metrology Optimization."

Gian Antonio Susto et al. (2020)

> Home

Details and statistics

DOI: 10.1109/TASE.2019.2929193

access: closed

type: Journal Article

metadata version: 2020-04-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tase/SustoMZM20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tase/SustoMZM20
Gian Antonio Susto, Marco Maggipinto, Federico Zocco, Seán F. McLoone:
Induced Start Dynamic Sampling for Wafer Metrology Optimization. IEEE Trans Autom. Sci. Eng. 17(1): 418-432 (2020)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.