![](https://dblp1.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp1.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp1.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
default search action
"Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor ..."
Shu-Kai S. Fan et al. (2020)
- Shu-Kai S. Fan
, Chia-Yu Hsu
, Du-Ming Tsai
, Fei He
, Chun-Chung Cheng:
Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 17(4): 1925-1936 (2020)
![](https://dblp1.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.