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"Reliability-aware Garbage Collection for Hybrid HBM-DRAM Memories."

Wenjie Liu et al. (2021)

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DOI: 10.1145/3431803

access: open

type: Journal Article

metadata version: 2022-01-08

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  dblp key:
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Wenjie Liu, Shoaib Akram, Jennifer B. Sartor, Lieven Eeckhout:
Reliability-aware Garbage Collection for Hybrid HBM-DRAM Memories. ACM Trans. Archit. Code Optim. 18(1): 10:1-10:25 (2021)

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