"Reliability assessment based on hazard rate model for an embedded OSS ..."

Yoshinobu Tamura, Shigeru Yamada (2013)

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DOI: 10.1002/STVR.455

access: closed

type: Journal Article

metadata version: 2020-04-01

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Yoshinobu Tamura, Shigeru Yamada:
Reliability assessment based on hazard rate model for an embedded OSS porting-phase. Softw. Test. Verification Reliab. 23(1): 77-88 (2013)

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