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"Improving dynamic domain reduction test data generation method by ..."

Esmaeel Nikravan, Saeed Parsa (2020)

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DOI: 10.1007/S11219-019-09471-4

access: closed

type: Journal Article

metadata version: 2023-08-28

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Esmaeel Nikravan, Saeed Parsa:
Improving dynamic domain reduction test data generation method by Euler/Venn reasoning system. Softw. Qual. J. 28(2): 823-851 (2020)

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