"Empirical mode decomposition: an analytical approach for sifting process."

Éric Deléchelle, Jacques Lemoine, Oumar Niang (2005)

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DOI: 10.1109/LSP.2005.856878

access: closed

type: Journal Article

metadata version: 2017-05-28

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Éric Deléchelle, Jacques Lemoine, Oumar Niang:
Empirical mode decomposition: an analytical approach for sifting process. IEEE Signal Process. Lett. 12(11): 764-767 (2005)

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