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"Learning Traces by Yourself: Blind Image Forgery Localization via Anomaly ..."
Tong Chen, Bin Li, Jinhua Zeng (2023)
- Tong Chen, Bin Li, Jinhua Zeng:
Learning Traces by Yourself: Blind Image Forgery Localization via Anomaly Detection With ViT-VAE. IEEE Signal Process. Lett. 30: 150-154 (2023)
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