Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Electronic Gauge for Micron Measurement and its Relevance to Industry 4.0."

Prathima B. A et al. (2021)

> Home

Details and statistics

DOI: 10.1007/S42979-021-00570-3

access: closed

type: Journal Article

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/sncs/ANMM21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/sncs/ANMM21
Prathima B. A, Sudha P. N, Suresh P. M, M. Mruthunjaya:
Electronic Gauge for Micron Measurement and its Relevance to Industry 4.0. SN Comput. Sci. 2(3): 195 (2021)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.