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"Dynamic IEEE Test Systems for Transient Analysis."

Panayiotis Demetriou et al. (2017)

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DOI: 10.1109/JSYST.2015.2444893

access: closed

type: Journal Article

metadata version: 2022-06-22

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Panayiotis Demetriou, Markos Asprou, Jairo Quirós-Tortós, Elias Kyriakides:
Dynamic IEEE Test Systems for Transient Analysis. IEEE Syst. J. 11(4): 2108-2117 (2017)

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