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"Summary of the Fourth International Workshop on Deep Learning for Testing ..."

Matteo Biagiola et al. (2023)

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DOI: 10.1145/3617946.3617953

access: closed

type: Journal Article

metadata version: 2023-11-13

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  - https://dblp.org/rec/journals/sigsoft/BiagiolaCSKSR23
Matteo Biagiola, Nicolás Cardozo, Donghwan Shin, Foutse Khomh, Andrea Stocco, Vincenzo Riccio:
Summary of the Fourth International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest 2023). ACM SIGSOFT Softw. Eng. Notes 48(4): 39-40 (2023)

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