"ExSIS: Extended sure independence screening for ultrahigh-dimensional ..."

Talal Ahmed, Waheed U. Bajwa (2019)

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DOI: 10.1016/J.SIGPRO.2019.01.018

access: closed

type: Journal Article

metadata version: 2020-02-22

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Talal Ahmed, Waheed U. Bajwa:
ExSIS: Extended sure independence screening for ultrahigh-dimensional linear models. Signal Process. 159: 33-48 (2019)

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