"Application of Three-Repetition Tests Scheme to Improve Integrated ..."

Chung-Huang Yeh, Jwu E. Chen (2022)

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DOI: 10.3390/S22114158

access: open

type: Journal Article

metadata version: 2022-09-26

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Chung-Huang Yeh, Jwu E. Chen:
Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect. Sensors 22(11): 4158 (2022)

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