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"A Multiscale Material Testing System for In Situ Optical and Electron ..."

Xuan Ye et al. (2017)

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DOI: 10.3390/S17081800

access: open

type: Journal Article

metadata version: 2022-12-07

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  dblp key:
  - journals/sensors/YeCFL17
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  - https://dblp.org/rec/journals/sensors/YeCFL17
Xuan Ye, Zhiguo Cui, Huajun Fang, Xide Li:
A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application. Sensors 17(8): 1800 (2017)

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