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"A 45 nm Stacked CMOS Image Sensor Process Technology for Submicron Pixel."

Seiji Takahashi et al. (2017)

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DOI: 10.3390/S17122816

access: open

type: Journal Article

metadata version: 2018-11-14

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  - journals/sensors/TakahashiHSWGHT17
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  persistent URL:
  - https://dblp.org/rec/journals/sensors/TakahashiHSWGHT17
Seiji Takahashi, Yi-Min Huang, Jhy-Jyi Sze, Tung-Ting Wu, Fu-Sheng Guo, Wei-Cheng Hsu, Tung-Hsiung Tseng, King Liao, Chin-Chia Kuo, Tzu-Hsiang Chen, Wei-Chieh Chiang, Chun-Hao Chuang, Keng-Yu Chou, Chi-Hsien Chung, Kuo-Yu Chou, Chien-Hsien Tseng, Chuan-Joung Wang, Dun-Nien Yaung:
A 45 nm Stacked CMOS Image Sensor Process Technology for Submicron Pixel. Sensors 17(12): 2816 (2017)

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