Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Lock-In Thermal Test Simulation, Influence, and Optimum Cycle Period for ..."

António Ramos Silva et al. (2023)

> Home

Details and statistics

DOI: 10.3390/S23010325

access: open

type: Journal Article

metadata version: 2023-02-10

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/sensors/SilvaVLM23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/sensors/SilvaVLM23
António Ramos Silva, Mário Vaz, Sofia Leite, Joaquim Mendes:
Lock-In Thermal Test Simulation, Influence, and Optimum Cycle Period for Infrared Thermal Testing in Non-Destructive Testing. Sensors 23(1): 325 (2023)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.