"Efficient Convolutional Neural Networks for Semiconductor Wafer Bin Map ..."

EunMi Shin, Chang D. Yoo (2023)

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DOI: 10.3390/S23041926

access: open

type: Journal Article

metadata version: 2023-03-23

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EunMi Shin, Chang D. Yoo:
Efficient Convolutional Neural Networks for Semiconductor Wafer Bin Map Classification. Sensors 23(4): 1926 (2023)

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