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"Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a ..."

Zhenman Shi et al. (2022)

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DOI: 10.3390/S22239400

access: open

type: Journal Article

metadata version: 2023-01-31

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  - journals/sensors/ShiSHXL22
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  - https://dblp.org/rec/journals/sensors/ShiSHXL22
Zhenman Shi, Mei Sang, Yaokang Huang, Lun Xing, Tiegen Liu:
Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a YOLOv5 Model. Sensors 22(23): 9400 (2022)

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