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"Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a ..."
Zhenman Shi et al. (2022)
- Zhenman Shi, Mei Sang
, Yaokang Huang, Lun Xing, Tiegen Liu:
Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a YOLOv5 Model. Sensors 22(23): 9400 (2022)
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