"Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning."

Thi Tram Anh Pham et al. (2023)

> Home

Details and statistics

DOI: 10.3390/S23063246

access: open

type: Journal Article

metadata version: 2023-04-29

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/sensors/PhamTCP23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/sensors/PhamTCP23
Thi Tram Anh Pham, Do Kieu Trang Thoi, Hyohoon Choi, Suhyun Park:
Defect Detection in Printed Circuit Boards Using Semi-Supervised Learning. Sensors 23(6): 3246 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.