


default search action
"Capacitive Measurements of SiO2 Films of Different Thicknesses Using a ..."
Hoontaek Lee, Kumjae Shin, Wonkyu Moon (2021)
- Hoontaek Lee
, Kumjae Shin, Wonkyu Moon:
Capacitive Measurements of SiO2 Films of Different Thicknesses Using a MOSFET-Based SPM Probe. Sensors 21(12): 4073 (2021)

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
