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"Defect Imaging Enhancement through Optimized Shape Factors of the RAPID ..."

Yonghee Lee, Younho Cho (2021)

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DOI: 10.3390/S21124029

access: open

type: Journal Article

metadata version: 2022-10-02

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Yonghee Lee, Younho Cho:
Defect Imaging Enhancement through Optimized Shape Factors of the RAPID Algorithm Based on Guided Wave Beam Pattern Analysis. Sensors 21(12): 4029 (2021)

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