"Non-Invasive Examination of Plant Surfaces by Opto-Electronic Means - ..."

Matthias Klemm et al. (2016)

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DOI: 10.3390/S16040452

access: open

type: Journal Article

metadata version: 2020-12-03

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Matthias Klemm, Olga Röttger, Lutz Damerow, Michael Blanke:
Non-Invasive Examination of Plant Surfaces by Opto-Electronic Means - Using Russet as a Prime Example. Sensors 16(4): 452 (2016)

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