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"Product Inspection Methodology via Deep Learning: An Overview."

Tae-Hyun Kim, Hye-Rin Kim, Yeong-Jun Cho (2021)

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DOI: 10.3390/S21155039

access: open

type: Journal Article

metadata version: 2021-10-14

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Tae-Hyun Kim, Hye-Rin Kim, Yeong-Jun Cho:
Product Inspection Methodology via Deep Learning: An Overview. Sensors 21(15): 5039 (2021)

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