Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A Comprehensive Dependability Model for QoM-Aware Industrial WSN When ..."

Thiago C. Jesus et al. (2020)

> Home

Details and statistics

DOI: 10.3390/S20226542

access: open

type: Journal Article

metadata version: 2020-12-29

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/sensors/JesusPCV20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/sensors/JesusPCV20
Thiago C. Jesus, Paulo Portugal, Daniel G. Costa, Francisco Vasques:
A Comprehensive Dependability Model for QoM-Aware Industrial WSN When Performing Visual Area Coverage in Occluded Scenarios. Sensors 20(22): 6542 (2020)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.