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"Performance Characterization of an xy-Stage Applied to Micrometric Laser ..."

Juan Jaramillo et al. (2017)

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DOI: 10.3390/S17020278

access: open

type: Journal Article

metadata version: 2023-08-08

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Juan Jaramillo, Artur Zarzycki, July Galeano, Patrick Sandoz:
Performance Characterization of an xy-Stage Applied to Micrometric Laser Direct Writing Lithography. Sensors 17(2): 278 (2017)

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