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"DG-GAN: A High Quality Defect Image Generation Method for Defect Detection."

Xiangjie He et al. (2023)

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DOI: 10.3390/S23135922

access: open

type: Journal Article

metadata version: 2023-08-18

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  dblp key:
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Xiangjie He, Zhongqiang Luo, Quanyang Li, Hongbo Chen, Feng Li:
DG-GAN: A High Quality Defect Image Generation Method for Defect Detection. Sensors 23(13): 5922 (2023)

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