"On-Machine LTS Integration for Layer-Wise Surface Quality Characterization ..."

Alejandro Fernández et al. (2024)

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DOI: 10.3390/S24113459

access: open

type: Journal Article

metadata version: 2024-08-02

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Alejandro Fernández, Pablo Zapico, David Blanco, Fernando Peña, Natalia Beltrán, Sabino Mateos Diaz:
On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P. Sensors 24(11): 3459 (2024)

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