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"Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: ..."
José Antonio Dueñas et al. (2023)
- José Antonio Dueñas, Alex Cobo, Luis López, Franco Galtarossa, Alain Goasduff, Daniele Mengoni, Ángel Miguel Sánchez Benítez:
Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol. Sensors 23(12): 5384 (2023)
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