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"Amplitude Dependence of Resonance Frequency and its Consequences for ..."

Omur E. Dagdeviren et al. (2019)

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DOI: 10.3390/S19204510

access: open

type: Journal Article

metadata version: 2020-05-30

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Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro, Tyler Enright, Peter Grütter:
Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy. Sensors 19(20): 4510 (2019)

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