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"Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a ..."

Calvin Yi-Ping Chao et al. (2023)

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DOI: 10.3390/S23187959

access: open

type: Journal Article

metadata version: 2024-02-10

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  - journals/sensors/ChaoWYLTHC23
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  - https://dblp.org/rec/journals/sensors/ChaoWYLTHC23
Calvin Yi-Ping Chao, Thomas Meng-Hsiu Wu, Shang-Fu Yeh, Chih-Lin Lee, Honyih Tu, Joey Chiao-Yi Huang, Chin-Hao Chang:
Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor. Sensors 23(18): 7959 (2023)

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