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"Rapid Measurement of Soybean Seed Viability Using Kernel-Based ..."

In-Suck Baek et al. (2019)

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DOI: 10.3390/S19020271

access: open

type: Journal Article

metadata version: 2023-07-06

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In-Suck Baek, Dewi Kusumaningrum, Lalit Mohan Kandpal, Santosh Lohumi, Changyeun Mo, Moon S. Kim, Byoung-Kwan Cho:
Rapid Measurement of Soybean Seed Viability Using Kernel-Based Multispectral Image Analysis. Sensors 19(2): 271 (2019)

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