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"Update of Single Event Effects Radiation Hardness Assurance of Readout ..."
Laurent Artola et al. (2018)
- Laurent Artola
, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert
, Christian Poivey:
Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature. Sensors 18(7): 2338 (2018)
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