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"Deep-Compact-Clustering Based Anomaly Detection Applied to ..."

Francisco Arellano-Espitia et al. (2021)

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DOI: 10.3390/S21175830

access: open

type: Journal Article

metadata version: 2021-09-16

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Francisco Arellano-Espitia, Miguel Delgado Prieto, Artvin Darien Gonzalez-Abreu, Juan Jose Saucedo Dorantes, Roque Alfredo Osornio-Rios:
Deep-Compact-Clustering Based Anomaly Detection Applied to Electromechanical Industrial Systems. Sensors 21(17): 5830 (2021)

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