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"Applying a dynamic threshold to improve cluster detection of LSI."

Pieter van der Spek, Steven Klusener (2011)

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DOI: 10.1016/J.SCICO.2010.12.004

access: open

type: Journal Article

metadata version: 2021-02-17

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Pieter van der Spek, Steven Klusener:
Applying a dynamic threshold to improve cluster detection of LSI. Sci. Comput. Program. 76(12): 1261-1274 (2011)

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