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"Test generation for sequential circuits using parallel fault simulation ..."
Yuzo Takamatsu, Isao Higashi, Tsuyoshi Kodama (1995)
- Yuzo Takamatsu, Isao Higashi, Tsuyoshi Kodama:
Test generation for sequential circuits using parallel fault simulation with random inputs. Syst. Comput. Jpn. 26(10): 24-34 (1995)
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