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"Consideration on automatic defect detection algorithm for stamped patterns ..."

Yoshihiro Shima, Seiji Kashioka, Toshikazu Yasue (1989)

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DOI: 10.1002/SCJ.4690200805

access: closed

type: Journal Article

metadata version: 2023-09-13

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Yoshihiro Shima, Seiji Kashioka, Toshikazu Yasue:
Consideration on automatic defect detection algorithm for stamped patterns in electronic parts. Syst. Comput. Jpn. 20(8): 48-58 (1989)

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