"Built - in concurrent testing for semiconductor random access memories by ..."

Yukiya Miura, Hideo Tamamoto, Yuichi Narita (1988)

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DOI: 10.1002/SCJ.4690190605

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type: Journal Article

metadata version: 2023-09-13

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Yukiya Miura, Hideo Tamamoto, Yuichi Narita:
Built - in concurrent testing for semiconductor random access memories by concurrently testing cells on a word-line. Syst. Comput. Jpn. 19(6): 50-62 (1988)

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