"A built-in test for functional testing in semiconductor random access memory."

Yukiya Miura, Hideo Tamamoto, Yuichi Narita (1987)

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DOI: 10.1002/SCJ.4690180907

access: closed

type: Journal Article

metadata version: 2023-09-13

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Yukiya Miura, Hideo Tamamoto, Yuichi Narita:
A built-in test for functional testing in semiconductor random access memory. Syst. Comput. Jpn. 18(9): 64-73 (1987)

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