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"Test sequence compaction methods for acyclic sequential circuits using a ..."

Toshinori Hosokawa et al. (2002)

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DOI: 10.1002/SCJ.1162

access: closed

type: Journal Article

metadata version: 2023-09-13

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Toshinori Hosokawa, Tomoo Inoue, Toshihiro Hiraoka, Hideo Fujiwara:
Test sequence compaction methods for acyclic sequential circuits using a time expansion model. Syst. Comput. Jpn. 33(10): 105-115 (2002)

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