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"Using ATPG vectors for BIST test pattern generator."

Takeshi Asakawa, Kazuhiko Iwasaki (2001)

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DOI: 10.1002/SCJ.1065

access: closed

type: Journal Article

metadata version: 2023-09-13

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Takeshi Asakawa, Kazuhiko Iwasaki:
Using ATPG vectors for BIST test pattern generator. Syst. Comput. Jpn. 32(11): 1-8 (2001)

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