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"Analyzing the value of technology based on the differences of patent ..."

Inchae Park, Yujin Jeong, Byungun Yoon (2017)

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DOI: 10.1007/S11192-017-2323-0

access: closed

type: Journal Article

metadata version: 2023-08-28

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Inchae Park, Yujin Jeong, Byungun Yoon:
Analyzing the value of technology based on the differences of patent citations between applicants and examiners. Scientometrics 111(2): 665-691 (2017)

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