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"The influence of knowledge source and ambidexterity in the thin film ..."

Mei-Chih Hu et al. (2014)

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DOI: 10.1007/s11192-013-1226-y

access: closed

type: Journal Article

metadata version: 2020-07-17

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  - journals/scientometrics/HuWLL14
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  - https://dblp.org/rec/journals/scientometrics/HuWLL14
Mei-Chih Hu, Ching-Yan Wu, Jung Hoon Lee, Yun-Chu Lu:
The influence of knowledge source and ambidexterity in the thin film transistor and liquid crystal display industry: evidence from Japan, Korea, and Taiwan. Scientometrics 99(2): 233-260 (2014)

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